Products Center
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Power Device Dynamic Characteristic Intelligent Test System AVATAR-DThe AVATAR-D series products are primarily used for double pulse testing (DPT, including turn-on characteristics, turn-off characteristics testing, reverse recovery characteristics testing), short-circuit safe operating area (SCSOA), and reverse-bias safe operating area (RBSOA) testing of devices su···More -
Power Device Static Characteristic Intelligent Test System AVATAR-SThe AVATAR-S series products are primarily used for testing the static parameters (ICES + VTH + IGES + VF + VCE(sat) + V(BR)CES + GFS + Kelvin) of devices such as IGBT,SiC, and MOSFET. The test procedure fully complies with the IEC60747 - 9 international standard.More -
Automotive Grade Module Reactive/Active Aging Test System - Maxwell-proThe Maxwell-pro system is designed for reactive power aging tests on automotive-grade power devices before delivery. It simulates the working conditions of power modules in new energy vehicles to eliminate early-failure devices and study device performance in extreme conditions.More -
Highly Accelerated Stress Test Intelligent Test System HASTThe HAST-1000 series is a smart test system for high-accelerated stress testing, mainly used for power devices like IGBT/DIODE/MOSFET/HEMT/BJT/SCR made of Si/SiC/GaN materials.More -
High-Temperature Reverse Bias/Gate Bias Screening Test System HTRB/HTGBThe HTRB/HTGB Screening System is a specialized testing platform designed for automotive-grade power modules, performing high-temperature reverse bias (HTRB) and gate bias (HTGB) stress tests to eliminate early-failure devices before product delivery. It supports both manual and fully automatic test···More -
Intelligent Environmental Aging Test Systems HTXB & H3TXBThe HTXB & H3TXB series are designed for environmental aging tests on power devices, such as IGBT/DIODE/MOSFET/HEMT/BJT/SCR devices made of Si/SiC/GaN materials, including HTRB/HTGB/H3TRB/HV-H3TRB tests.More
