Intelligent Environmental Aging Test Systems HTXB & H3TXB
The HTXB & H3TXB series are designed for environmental aging tests on power devices, such as IGBT/DIODE/MOSFET/HEMT/BJT/SCR devices made of Si/SiC/GaN materials, including HTRB/HTGB/H3TRB/HV-H3TRB tests.
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6000VMaximum test voltage
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can detect pA-level gate currentTest capability
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< 2/3 that of competing systemsHTXB covers an area
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Product Test Capability and Main Advantages
One device can perform four tests: HTGB/HTRB/H3TRB/HV-H3TRB.
Up to 6000V testing voltage and pA-level gate current testing.
Supports alternate and simultaneous testing of upper and lower bridges for HTRB and H3TRB tests.
Can perform HV-H3TRB on up to 1920 discrete devices at once.
HTXB has a floor space less than 2/3 of competing systems.
HTXB
H3TXB
HTXB-SE
H3TXB-SE
Product Consultation
