Highly Accelerated Stress Test Intelligent Test System HAST
The HAST-1000 series is a smart test system for high-accelerated stress testing, mainly used for power devices like IGBT/DIODE/MOSFET/HEMT/BJT/SCR made of Si/SiC/GaN materials.
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10V-1000VTest voltage range
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0~98mAThe monitoring range of ICES(IDSS/IR)
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0.1μAResolution
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1% of reading value ±0.5μAAccuracy
Product Test Capability and Main Advantages
Highly accelerated stress environment chamber: Supports unsaturated control, wet saturation control, and dry/wet bulb temperature control.
Air HAST and regular HAST testing modes.
4 channels, with each channel capable of testing up to 320 discrete devices in a single chamber.
Single chamber capacity: 51L, with an optional dual-chamber configuration (51L × 2).
36 test terminals (rated 1000V/1A).
Test voltage range: 10V–1000V.
All bias voltage power supplies adopt high-precision sources.
ICES (IDSS/IR) monitoring range: 0–98mA.
Resolution: 0.1μA.
Accuracy: 1% of reading ±0.5μA.
Real-time data and curve recording for test analysis.
HAST
Product Consultation
