Breakdown voltage, leakage current, threshold voltage (compatible with JEP183 VT test method), on-state voltage drop, on-state resistance, gate leakage current, Gfs, Vp, Ciss/Coss/Crss/Rg, Kelvin test, etc.

Maximum test current capability: 2000A；Maximum test voltage capability: 3000V.

Temperature control from -55℃ to 200℃, supporting simultaneous high-and low-temperature testing.

Supports high temperature, normal temperature and low temperature testing, with the maximum testing temperature being 200℃.

Supports various IGBT and SiC module packages and topologies, such as single-tube, half-bridge, full-bridge, three-phase bridge, ThreeLevel, IPM, etc., and can support up to 18 IGBTs for automatic switching tests.

High-voltage CP test: 8kV/200A.

DBC/AMB testing: supports vacuum extraction and high-pressure nitrogen filling, anti-oxidation and anti-spark.

Supports SECS/GEM communication protocols.

Extremely high test accuracy, efficiency, consistency, and reliability.

Verified by a large number of tests from several leading automotive-grade module manufacturers.

Suitable for both semi-automatic and fully-automatic testing.

Can be connected to fully-automatic probe stations (Formfactor/TSK/Sidea) to complete CP testing.