Reliability Tester
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Highly Accelerated Stress Test Intelligent Test System HASTThe HAST-1000 series is a smart test system for high-accelerated stress testing, mainly used for power devices like IGBT/DIODE/MOSFET/HEMT/BJT/SCR made of Si/SiC/GaN materials.More -
High-Temperature Reverse Bias/Gate Bias Screening Test System HTRB/HTGBThe HTRB/HTGB Screening System is a specialized testing platform designed for automotive-grade power modules, performing high-temperature reverse bias (HTRB) and gate bias (HTGB) stress tests to eliminate early-failure devices before product delivery. It supports both manual and fully automatic test···More -
Intelligent Environmental Aging Test Systems HTXB & H3TXBThe HTXB & H3TXB series are designed for environmental aging tests on power devices, such as IGBT/DIODE/MOSFET/HEMT/BJT/SCR devices made of Si/SiC/GaN materials, including HTRB/HTGB/H3TRB/HV-H3TRB tests.More
