Reliability Test Solution
Second-level Power Cycling (PCsec) & Minute-level Power Cycling (PCmin)
Temperature-sensitive parameter (TSP) calibration — K-curve testing
Steady-state thermal resistance (Rth) / Transient thermal impedance (Zth)
PR's ThermalX device obtains the differential and integral structure functions through the dual-interface method.
Second-level Power Cycling (IOL or PC sec) - Used to assess the lifetime of bond wires and solder layers beneath the chip
Minute-level Power Cycling (TC/PC min) - Used to evaluate the lifetime of solder layers
PCsec：Vcesat Variation with Cycle Count
VT Measured waveform
