Parameter Test Solution
Static Test Solution AVATAR-S
- SiC MOSFET Static Testing Solution——Vth Testing TechnologyJEP183 provides a SiC MOSFET Vth testing method, using pre-bias to eliminate Vth transient drift component. The fluctuation of VTH can be reduced to the level of 10mV.
Vt waveform
- SiC MOSFET Static Test Solution——Cies/Cres/Coes/Rg Testing TechnologyOptional Cies/Cres/Coes/Rg testing expansion resources are available on AVATAR-S, enabling mass production parasitic capacitance/gate resistance testing.
Capacitance testing expansion board
